Behavioral analysis of insulated gate bipolar transistors during hard and soft turn-off
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Behavioral analysis of insulated gate bipolar transistors during hard and soft turn-off
- Publication date
- 2007
- Collection
- university_of_illinois_urbana-champaign; americana
- Contributor
- University of Illinois Urbana-Champaign
- Language
- English
ix, 72 leaves, bound 29 cm
Printout
Thesis (M.S.)--University of Illinois at Urbana-Champaign, 2007
Includes bibliographical references (leaves 68-72)
Printout
Thesis (M.S.)--University of Illinois at Urbana-Champaign, 2007
Includes bibliographical references (leaves 68-72)
Notes
No copyright page.
- Addeddate
- 2019-06-21 17:36:57
- Barcode
- 30112083474046
- Bookplateleaf
- 0010
- Call number
- Q. 621.3 Tb07ba
- Camera
- Sony Alpha-A6300 (Control)
- Copyright_statement
- In copyright. Digitized with permission. Contact digicc@library.illinois.edu for information.
- Entry_number
- 2019_IA_CART_0621RUSH-01
- External-identifier
- urn:oclc:record:1156362916
- Foldoutcount
- 0
- Identifier
- behavioralanalys00bane
- Identifier-ark
- ark:/13960/t8fg1h01x
- Invoice
- 47
- Local_id
- 5669055
- Ocr_converted
- abbyy-to-hocr 1.1.37
- Ocr_module_version
- 0.0.21
- Openlibrary_edition
- OL27012149M
- Openlibrary_work
- OL19800673W
- Page-progression
- lr
- Page_number_confidence
- 0
- Page_number_module_version
- 1.0.3
- Pageprogression
- lr
- Pages
- 172
- Ppi
- 300
- Republisher_date
- 20190624071043
- Republisher_operator
- associate-lauretta-doellman@archive.org
- Republisher_time
- 263
- Scandate
- 20190621195152
- Scanner
- scribe2.il.archive.org
- Scanningcenter
- il
- Tts_version
- 2.1-final-2-gcbbe5f4
- Worldcat (source edition)
- 252752888
- Full catalog record
- MARCXML
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